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Volumn 45, Issue 5, 1994, Pages 106-111
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Automation of electrical overstress characterization for semiconductor devices
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NONE
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Author keywords
[No Author keywords available]
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Indexed keywords
AUTOMATION;
CMOS INTEGRATED CIRCUITS;
ELECTRIC DISCHARGES;
ELECTROSTATICS;
EQUIVALENT CIRCUITS;
FAILURE ANALYSIS;
MACROS;
MOS DEVICES;
PULSE GENERATORS;
SEMICONDUCTOR DEVICE MODELS;
STRESSES;
TRANSISTORS;
AUTOMATIC TEST SYSTEM;
DEVICE UNDER TEST;
ELECTRICAL OVERSTRESS;
ELECTROSTATIC DISCHARGE;
NMOS TRANSISTOR;
SEMICONDUCTOR DEVICE TESTING;
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EID: 0028516542
PISSN: 00181153
EISSN: None
Source Type: Journal
DOI: None Document Type: Article |
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Times cited : (10)
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References (10)
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