High efficiency, dual collection mode near-field scanning optical microscope

Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Volumn 16, Issue 4, 1998, Pages 1948-1952

  Stranick, Stephan J ^a   Richter, Lee J ^a   Cavanagh, Richard R ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0003588462     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.590113     Document Type: Article

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