Increasing throughput of a near-field optical fiber probe over 1000 times by the use of a triple-tapered structure

Applied Physics Letters

Volumn 73, Issue 15, 1998, Pages 2090-2092

  Yatsui, T ^a   Kourogi, M ^a,b   Ohtsu, M ^a,b  

^a TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

^b KANAGAWA ACADEMY OF SCIENCE AND TECHNOLOGY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ETCHING; FOCUSING; ION BEAMS; LIGHT POLARIZATION; LIGHT PROPAGATION; OPTICAL FIBERS; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTOR LASERS;

OPTICAL FIBER PROBE; OPTICAL NEAR FIELD INTENSITY;

PROBES;

EID: 0032511648     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.122387     Document Type: Article

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