Scanning near-field infrared microscope with a free electron laser illumination source

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 2863, Issue , 1996, Pages 54-63

  Hong, Mi Kyung ^a   Erramilli, Shyamsunder ^b   Huie, Phil ^c   James, Greg ^d   Jeung, Andrew ^d  

^a PRINCETON UNIVERSITY   (United States)

^b BOSTON UNIVERSITY   (United States)

^c STANFORD UNIVERSITY SCHOOL OF MEDICINE   (United States)

^d STANFORD UNIVERSITY   (United States)

Author keywords

Free Electron Laser; Scanning near field infrared microscope

Indexed keywords

AMIDES; FREE ELECTRON LASERS; GALLIUM ARSENIDE; III-V SEMICONDUCTORS; INFRARED RADIATION; INFRARED SPECTROSCOPY; MICROMETERS; MICROSCOPES; NEAR FIELD SCANNING OPTICAL MICROSCOPY; OPTICAL DESIGN; OPTICAL ENGINEERING; SCANNING; SEMICONDUCTING GALLIUM ARSENIDE; SEMICONDUCTOR LASERS; TISSUE;

ILLUMINATION SOURCES; INFRARED MICROSCOPE; INFRARED-TRANSMITTING FIBERS; SCANNING NEAR FIELD; SENSITIVE TECHNIQUES; SUBMICROMETER RESOLUTION; SUBSURFACE FEATURES; SUBWAVELENGTH RESOLUTION;

ELECTRONS;

EID: 85077781699     PISSN: 0277786X     EISSN: 1996756X     Source Type: Conference Proceeding    
DOI: 10.1117/12.256258     Document Type: Conference Paper

References (12)

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12. M. K. Hong, A. Jeung, D. Francis and S. Erramilli, in preparation.