Use of multiple IDDQ test metrics for outlier identification

Proceedings of the IEEE VLSI Test Symposium

Volumn 2003-January, Issue , 2003, Pages 31-38

  Sabade, S S ^a   Walker, D M H ^a  

^a TEXAS A AND M UNIVERSITY   (United States)

Author keywords

Chromium; Circuit faults; Circuit testing; Circuit topology; Complexity theory; Computer science; Current measurement; Fluctuations; Leakage current; Production

Indexed keywords

CHROMIUM; COMPUTER SCIENCE; ELECTRIC CURRENT MEASUREMENT; ELECTRIC NETWORK TOPOLOGY; INTEGRATED CIRCUIT TESTING; LEAKAGE CURRENTS; PRODUCTION; VLSI CIRCUITS;

CIRCUIT FAULTS; CIRCUIT TESTING; COMPLEXITY THEORY; FLUCTUATIONS; NEIGHBOR CURRENT RATIOS; OUTLIER IDENTIFICATION; RELIABILITY REQUIREMENTS; SPATIAL CORRELATIONS;

STATISTICS;

EID: 84943541421     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/VTEST.2003.1197630     Document Type: Conference Paper

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