Reliability, test, and IDDQ measurements

IEEE International Workshop on IDDQ Testing, Digest of Papers

Volumn , Issue , 1997, Pages 96-102

  Hawkins, Ch F ^a   Keshavarzi, A ^a   Soden, J M ^a  

^a UNIVERSITY OF NEW MEXICO   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; ELECTRIC CURRENTS; MEASUREMENTS; PROBABILITY; RELIABILITY; TESTING;

FAILURE MECHANISMS; IDDQ TEST;

INTEGRATED CIRCUITS;

EID: 0031351388     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (20)