Increasing the IDDQ test resolution using current prediction

IEEE International Test Conference (TC)

Volumn , Issue , 2000, Pages 217-224

  Variyam, Pramodchandran N ^a  

^a TEXAS INSTRUMENTS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CURRENT MEASUREMENT; LEAKAGE CURRENTS; MATHEMATICAL MODELS; REGRESSION ANALYSIS; SEMICONDUCTOR DEVICE MODELS; SEMICONDUCTOR DEVICE TESTING;

PROCESS DISTURBANCE; REGRESSION MODELS; RESIDUAL OF CURRENT PREDICTION; SUBMICRON INTEGRATED CIRCUITS;

INTEGRATED CIRCUITS;

EID: 0034478410     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (13)