Clustering based techniques for IDDQ testing

IEEE International Test Conference (TC)

Volumn , Issue , 1999, Pages 730-737

  Jandhyala, Sri ^a   Balachandran, Hari ^a   Jayasumana, Anura P ^a  

^a TEXAS INSTRUMENTS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; DESIGN FOR TESTABILITY; ELECTRIC CURRENT DISTRIBUTION; ELECTRIC CURRENT MEASUREMENT; LEAKAGE CURRENTS; STATISTICAL METHODS; THRESHOLD VOLTAGE;

CLUSTERING BASED TECHNIQUES; DEVICE UNDER TEST; LEAKAGE CURRENT TESTING; QUIESCENT CURRENT DISTRIBUTIONS;

INTEGRATED CIRCUIT TESTING;

EID: 0033317246     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (12)