Improving Delta-IDDQ-based test methods

IEEE International Test Conference (TC)

Volumn , Issue , 2000, Pages 207-216

  Thibeault, C ^a  

^a ÉCOLE DE TECHNOLOGIE SUPÉRIEURE   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CURRENT MEASUREMENT; LEAKAGE CURRENTS; OPTIMIZATION; SEMICONDUCTOR DEVICE MODELS; SEMICONDUCTOR DEVICE TESTING; SENSITIVITY ANALYSIS;

COMPLEX DEEP SUBMICRON TECHNOLOGY; CURRENT TEST VECTOR; PROCESS DRIFTING; VARIANCE REDUCTION;

INTEGRATED CIRCUITS;

EID: 0034476294     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (22)