Screening for known good die (KGD) based on defect clustering: An experimental study

IEEE International Test Conference (TC)

Volumn , Issue , 1997, Pages 362-369

  Singh, Adit D ^a   Nigh, Phil ^a   Krishna, C M ^a  

^a AUBURN UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

MATHEMATICAL MODELS; MULTICHIP MODULES; OPTIMIZATION; SILICON WAFERS; STATISTICAL METHODS;

KNOWN GOOD DIE (KGD);

INTEGRATED CIRCUIT TESTING;

EID: 0031341146     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (11)