DECOUPLE: defect current detection in deep submicron IDDQ

IEEE International Test Conference (TC)

Volumn , Issue , 2000, Pages 199-206

  Okuda, Yukio ^a  

^a SONY CORPORATION   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

BACK BIASING; DEEP SUBMICRON DEVICES; DEFECT CURRENT OBSERVATION; GATE INDUCED DRAIN LEAKAGE; PARAMETRIC DEFECT CURRENTS;

COMPUTER SIMULATION; DESIGN FOR TESTABILITY; ELECTRIC CONTACTS; LEAKAGE CURRENTS; RELIABILITY; SEMICONDUCTOR DEVICE MODELS; SEMICONDUCTOR DEVICE TESTING; STATISTICAL METHODS;

CMOS INTEGRATED CIRCUITS;

EID: 0034479270     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (23)