So what is an optimal test mix? A discussion of the SEMATECH methods experiment

IEEE International Test Conference (TC)

Volumn , Issue , 1997, Pages 1037-1038

  Nigh, Phil ^a   Needham, Wayne ^a   Butler, Ken ^a   Maxwell, Peter ^a   Aitken, Rob ^a   Maly, Wojciech ^a  

^a IBM   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

APPLICATION SPECIFIC INTEGRATED CIRCUITS; COMPUTER AIDED DESIGN; COMPUTER AIDED NETWORK ANALYSIS; INTEGRATED CIRCUIT MANUFACTURE;

OPTIMAL TEST MIX;

INTEGRATED CIRCUIT TESTING;

EID: 0031340072     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (3)