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Volumn 15, Issue , 2015, Pages S89-S94

The effects of thermally-induced biaxial stress on the structural, electrical, and optical properties of Cu2O thin films

Author keywords

Biaxial stress; Cu2O film; Hall measurements; Optical dispersion model; Spectroscopic ellipsometry

Indexed keywords

ATOMIC FORCE MICROSCOPY; CARRIER CONCENTRATION; CARRIER MOBILITY; DISPERSION (WAVES); ELECTROMAGNETIC WAVE ABSORPTION; ELLIPSOMETRY; FILM GROWTH; GROWTH TEMPERATURE; HALL MOBILITY; LIGHT ABSORPTION; MAGNETRON SPUTTERING; OPTICAL LATTICES; OPTICAL PROPERTIES; REFRACTIVE INDEX; SILICON ON INSULATOR TECHNOLOGY; SPECTROSCOPIC ELLIPSOMETRY; THIN FILMS; X RAY DIFFRACTION;

EID: 84942363296     PISSN: 15671739     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.cap.2015.04.037     Document Type: Article
Times cited : (19)

References (54)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.