Dielectric modeling of transmittance spectra of thin ZnO:Al films

Thin Solid Films

Volumn 496, Issue 2, 2006, Pages 520-525

  Qiao, Zhaohui ^a   Agashe, Chitra ^b   Mergel, Dieter ^a  

^a UNIVERSITY OF DUISBURG ESSEN   (Germany)

^b FORSCHUNGSZENTRUM JÜLICH   (Germany)

Author keywords

Electrical properties (112); Optical properties (345); Zinc oxide (563)

Indexed keywords

CARRIER CONCENTRATION; DAMPING; ELECTRIC VARIABLES MEASUREMENT; ELECTRON MOBILITY; FILM GROWTH; PERMITTIVITY; REFRACTIVE INDEX; ZINC OXIDE;

BAND GAP TRANSITIONS; DRUDGE MOBILITY; ELECTRON EXCITATIONS; TRANSMITTANCE SPECTRA;

THIN FILMS;

EID: 28044454791     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2005.08.282     Document Type: Article

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