Microstructure, optical property, and electronic band structure of cuprous oxide thin films

Journal of Applied Physics

Volumn 110, Issue 10, 2011, Pages

  Park, Jun Woo ^a   Jang, Hyungkeun ^a   Kim, Sung ^a   Choi, Suk Ho ^a   Lee, Hosun ^a   Kang, Joongoo ^b   Wei, Su Huai ^b  

^a Kyung Hee University   (South Korea)

^b NATIONAL RENEWABLE ENERGY LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CRITICAL POINTS; CUPROUS OXIDE; DIELECTRIC FUNCTIONS; ELECTRONIC BAND STRUCTURE; EXPERIMENTAL DATA; GRANULAR STRUCTURESS; HIGH ENERGY; LUMINESCENCE PROPERTIES; PHOTOLUMINESCENCE PEAK; PHOTOLUMINESCENCE SPECTRUM; RADIO FREQUENCY SPUTTERING; SECOND DERIVATIVE SPECTRA; STANDARD CRITICAL POINT;

BAND STRUCTURE; COPPER; DENSITY FUNCTIONAL THEORY; DEPOSITION; HIGH ENERGY PHYSICS; OPTICAL PROPERTIES; PHOTOLUMINESCENCE; SPECTROSCOPIC ELLIPSOMETRY; THIN FILMS; VAPOR DEPOSITION;

OXIDE FILMS;

EID: 82555202682     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3660782     Document Type: Conference Paper

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