Determination of the optical constants of zinc oxide thin films by spectroscopic ellipsometry

Applied Physics Letters

Volumn 72, Issue 25, 1998, Pages 3261-3263

  Washington, P L ^a   Ong, H C ^a   Dai, J Y ^a   Chang, R P H ^a  

^a Northwestern University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000546768     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.121617     Document Type: Article

References (15)

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