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Thin Solid Films

Volumn 396, Issue 1-2, 2001, Pages 90-96

Optical and structural properties of nanocrystalline copper oxide thin films prepared by activated reactive evaporation

(2) Balamurugan, B a Mehta, B R a

a INDIAN INSTITUTE OF TECHNOLOGY DELHI (India)

Author keywords

Cuprous oxide; Nanocrystalline thin films; Optical properties; Structural properties; X Ray diffraction

Indexed keywords

COPPER OXIDES; EVAPORATION; FOURIER TRANSFORM INFRARED SPECTROSCOPY; NANOSTRUCTURED MATERIALS; OPTICAL PROPERTIES; SPECTROPHOTOMETERS; STOICHIOMETRY; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS;

NANOCRYSTALLINE THIN FILMS;

METALLIC FILMS;

EID: 0035929032 PISSN: 00406090 EISSN: None Source Type: Journal
DOI: 10.1016/S0040-6090(01)01216-0 Document Type: Article

Times cited : (378)

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