SCOPUS 정보 검색 플랫폼 - 논문 보기

메뉴 건너뛰기

Journal of Crystal Growth

Volumn 287, Issue 1, 2006, Pages 105-111

Influence of annealing on optical properties and surface structure of ZnO thin films

(3) Liu, Y C a Tung, S K a Hsieh, J H b

a SINGAPORE INSTITUTE OF MANUFACTURING TECHNOLOGY (Singapore)

b MING CHI UNIVERSITY OF TECHNOLOGY (Taiwan)

Author keywords

A1. Annealing; A1. Optical properties; A1. Surface structure; B1. Zinc oxide

Indexed keywords

ANNEALING; ATOMIC FORCE MICROSCOPY; OPTICAL PROPERTIES; SPECTROSCOPIC ANALYSIS; SURFACE STRUCTURE; THIN FILMS;

DIELECTRIC FUNCTION; FILTERED CATHODIC VACUUM ARC TECHNIQUE; PHOTON ENERGIES; SPECTROSCOPIC ELLIPSOMETRY (SE);

ZINC OXIDE;

EID: 29844448847 PISSN: 00220248 EISSN: None Source Type: Journal
DOI: 10.1016/j.jcrysgro.2005.10.052 Document Type: Article

Times cited : (97)

References (18)

1
- 2542422532
- D.M. Bagnall, Y.F. Chen, Z. Zhu, T. Yao, S. Koyama, M.Y. Shen, and T. Goto Appl. Phys. Lett. 70 1997 2230
- (1997) Appl. Phys. Lett. , vol.70 , pp. 2230
- Bagnall, D.M.¹ Chen, Y.F.² Zhu, Z.³ Yao, T.⁴ Koyama, S.⁵ Shen, M.Y.⁶ Goto, T.⁷

2
- 0032648286
- D.R. Clarke J. Am. Ceram. Soc. 82 1999 485
- (1999) J. Am. Ceram. Soc. , vol.82 , pp. 485
- Clarke, D.R.¹

3
- 36449002939
- R. Scheer, T. Walter, H.W. Wshock, M.L. Fearheiley, and H.J. Lewerenz Appl. Phys. Lett. 63 1993 3294
- (1993) Appl. Phys. Lett. , vol.63 , pp. 3294
- Scheer, R.¹ Walter, T.² Wshock, H.W.³ Fearheiley, M.L.⁴ Lewerenz, H.J.⁵

4
- 0000288835
- Y.F. Chen, D.M. Bagnall, H.J. Koh, K.T. Park, K.J. Hiraga, Z.Q. Zhu, and T. Yao J. Appl. Phys. 84 1998 3912
- (1998) J. Appl. Phys. , vol.84 , pp. 3912
- Chen, Y.F.¹ Bagnall, D.M.² Koh, H.J.³ Park, K.T.⁴ Hiraga, K.J.⁵ Zhu, Z.Q.⁶ Yao, T.⁷

5
- 0142109458
- Z.K. Tang, G.K.L. Wong, P. Yu, M. Kawasaki, A. Ohtomo, H. Koinuma, and Y. Segawa Appl. Phys. Lett. 72 1998 3270
- (1998) Appl. Phys. Lett. , vol.72 , pp. 3270
- Tang, Z.K.¹ Wong, G.K.L.² Yu, P.³ Kawasaki, M.⁴ Ohtomo, A.⁵ Koinuma, H.⁶ Segawa, Y.⁷

6
- 2442568905
- F.K. Shan, B.I. Kim, G.X. Liu, Z.F. Liu, J.Y. Sohn, W.J. Lee, B.C. Shin, and Y.A. Yu J. Appl. Phys. 95 2004 4772
- (2004) J. Appl. Phys. , vol.95 , pp. 4772
- Shan, F.K.¹ Kim, B.I.² Liu, G.X.³ Liu, Z.F.⁴ Sohn, J.Y.⁵ Lee, W.J.⁶ Shin, B.C.⁷ Yu, Y.A.⁸

7
- 0038624082
- S.J. Chen, Y.C. Liu, J.G. Ma, Y.M. Lu, J.Y. Zhang, D.Z. Shen, and X.W. Fan J. Crystal Growth 254 2003 86
- (2003) J. Crystal Growth , vol.254 , pp. 86
- Chen, S.J.¹ Liu, Y.C.² Ma, J.G.³ Lu, Y.M.⁴ Zhang, J.Y.⁵ Shen, D.Z.⁶ Fan, X.W.⁷

8
- 0036801226
- G.H. Lee, T. Kawazoe, and M. Ohtsu Solid State Commun. 124 2002 163
- (2002) Solid State Commun. , vol.124 , pp. 163
- Lee, G.H.¹ Kawazoe, T.² Ohtsu, M.³

9
- 0036531461
- A. Yamamoto, T. Kido, T. Goto, Y.F. Chen, and T. Yao Solid State Commun. 122 2002 29
- (2002) Solid State Commun. , vol.122 , pp. 29
- Yamamoto, A.¹ Kido, T.² Goto, T.³ Chen, Y.F.⁴ Yao, T.⁵

10
- 0034273985
- T. Minemoto, T. Negami, S. Nishiwaki, H. Takakura, and Y. Hamakawa Thin Solid Films 372 2000 173
- (2000) Thin Solid Films , vol.372 , pp. 173
- Minemoto, T.¹ Negami, T.² Nishiwaki, S.³ Takakura, H.⁴ Hamakawa, Y.⁵

11
- 0037420055
- S.S. Chang, C.H. Park, and S.W. Park Mater. Chem. Phys. 79 2003 9
- (2003) Mater. Chem. Phys. , vol.79 , pp. 9
- Chang, S.S.¹ Park, C.H.² Park, S.W.³

12
- 0000397042
- T. Makino, C.H. Chia, N.T. Tuan, H.D. Sun, Y. Segawa, M. Kawasaki, A. Ohtomo, K. Tamura, and H. Koinuma Appl. Phys. Lett. 77 2000 975
- (2000) Appl. Phys. Lett. , vol.77 , pp. 975
- Makino, T.¹ Chia, C.H.² Tuan, N.T.³ Sun, H.D.⁴ Segawa, Y.⁵ Kawasaki, M.⁶ Ohtomo, A.⁷ Tamura, K.⁸ Koinuma, H.⁹

13
- 0000939615
- A. Ohtomo, M. Kawasaki, T. Koida, K. Masubuchi, H. Koinuma, Y. Sakurai, Y. Yoshida, T. Yasuda, and Y. Segawa Appl. Phys. Lett. 72 1998 2466
- (1998) Appl. Phys. Lett. , vol.72 , pp. 2466
- Ohtomo, A.¹ Kawasaki, M.² Koida, T.³ Masubuchi, K.⁴ Koinuma, H.⁵ Sakurai, Y.⁶ Yoshida, Y.⁷ Yasuda, T.⁸ Segawa, Y.⁹

14
- 0035943846
- W.I. Park, G.C. Yi, and H.M. Jang Appl. Phys. Lett. 79 2001 2022
- (2001) Appl. Phys. Lett. , vol.79 , pp. 2022
- Park, W.I.¹ Yi, G.C.² Jang, H.M.³

15
- 2542482771
- S.F. Yu, C. Yuen, S.P. Lau, and H.W. Lee Appl. Phys. Lett. 84 2004 3244
- (2004) Appl. Phys. Lett. , vol.84 , pp. 3244
- Yu, S.F.¹ Yuen, C.² Lau, S.P.³ Lee, H.W.⁴

16
- 0003684325
- Wiley New York
- H.G. Tompkins, and W.A. McGahan Spectroscopic Ellipsometry and Reflectometry 1999 Wiley New York pp. 93-94
- (1999) Spectroscopic Ellipsometry and Reflectometry
- Tompkins, H.G.¹ McGahan, W.A.²

17
- 0038299801
- O. Auciello, A.R. Krauss, In Situ Real-Time Characterization of Thin Films, 2001, pp. 64-66.
- (2001) In Situ Real-time Characterization of Thin Films , pp. 64-66
- Auciello, O.¹ Krauss, A.R.²

18
- 0028462352
- R. Dahmani, L. Salamanca-Riba, N.V. Nguyen, D. Chandler-Horowitz, and B.T. Jonker J. Appl. Phys. 76 1 1994 514
- (1994) J. Appl. Phys. , vol.76 , Issue.1 , pp. 514
- Dahmani, R.¹ Salamanca-Riba, L.² Nguyen, N.V.³ Chandler-Horowitz, D.⁴ Jonker, B.T.⁵

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.