Characterization of biaxial stress and its effect on optical properties of ZnO thin films

Applied Physics Letters

Volumn 91, Issue 2, 2007, Pages

  Li, Y F ^a,b   Yao, B ^a   Lu, Y M ^a   Cong, C X ^a   Zhang, Z Z ^a   Gai, Y Q ^a   Zheng, C J ^a   Li, B H ^a   Wei, Z P ^a   Shen, D Z ^a   Fan, X W ^a   Xiao, L ^c   Xu, S C ^c   Liu, Y ^c  

^a CHANGCHUN INSTITUTE OF OPTICS   (China)

^b UNIVERSITY OF CHINESE ACADEMY OF SCIENCES   (China)

^c JILIN NORMAL UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; ENERGY GAP; LATTICE MISMATCH; QUARTZ; STRESS ANALYSIS; X RAY DIFFRACTION; ZINC OXIDE;

BIAXIAL STRESS; STRESS-DEPENDENT BAND GAP; THERMAL MISMATCH;

THIN FILMS;

EID: 34547141163     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2757149     Document Type: Article

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