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Volumn 130, Issue , 2014, Pages 696-703

Photoluminescence and infrared spectroscopy for the study of defects in silicon for photovoltaic applications

Author keywords

Defects; Impurities; IR spectroscopy; mc Si; Photoluminescence; SoG Si

Indexed keywords

IMPURITIES; INFRARED SPECTROSCOPY; MICROELECTRONICS; PHOTOLUMINESCENCE; SILICON;

EID: 84907219638     PISSN: 09270248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.solmat.2014.02.004     Document Type: Article
Times cited : (30)

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