Study of defects and impurities in multicrystalline silicon grown from metallurgical silicon feedstock

Materials Science and Engineering: B

Volumn 159-160, Issue C, 2009, Pages 274-277

  Binetti, S ^a   Libal, J ^a   Acciarri, M ^a   Di Sabatino, M ^b   Nordmark, H ^c   Ovrelid E J ^b   Walmsley, J C ^b,c   Holmestad, R ^c  

^a UNIVERSITY OF MILANO BICOCCA   (Italy)

^b SINTEF MATERIALS AND CHEMISTRY   (Norway)

^c NORWEGIAN UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Norway)

Author keywords

EBIC; Gettering; Impurities; Lifetime; Metallurgical silicon; Photoluminescence

Indexed keywords

GRAIN BOUNDARIES; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; IMPURITIES; INFRARED SPECTROSCOPY; METALLURGY; METALS; PHOTOLUMINESCENCE; SILICON SOLAR CELLS;

DEFECT AND IMPURITIES; EBIC; GETTERING; IMPURITIES IN; LIFETIME; METALLURGICAL ROUTES; METALLURGICAL SILICON; MULTICRYSTALLINE; PHOTOVOLTAIC MARKETS; SILICON FEEDSTOCKS;

SILICON;

EID: 67349120218     PISSN: 09215107     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.mseb.2008.05.013     Document Type: Article

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