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Volumn 38, Issue 2, 2014, Pages 238-244

Annealing effects of ZnO thin films on p-Si(100) substrate deposited by PFCVAD

Author keywords

Kubelka Munk function; Raman scattering; ZnO

Indexed keywords

ANNEALING; OPTICAL PROPERTIES; RAMAN SCATTERING; SILICON; SUBSTRATES; X RAY DIFFRACTION ANALYSIS; ZINC OXIDE;

EID: 84905984246     PISSN: 13000101     EISSN: 13036122     Source Type: Journal    
DOI: 10.3906/fiz-1310-3     Document Type: Article
Times cited : (11)

References (37)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.