The effect of annealing on structural and optical properties of ZnO thin films grown by pulsed filtered cathodic vacuum arc deposition

Journal of Physics Condensed Matter

Volumn 18, Issue 27, 2006, Pages 6391-6400

  Şenadim, Ebru ^a   Kavak, Hamide ^a   Esen, Ramazan ^a  

^a CUKUROVA UNIVERSITY   (Turkey)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; CRYSTALLOGRAPHY; DEPOSITION; GLASS; OPTICAL PROPERTIES; REFRACTIVE INDEX; ULTRAVIOLET SPECTROMETERS; X RAY DIFFRACTION; ZINC OXIDE;

CATHODIC VACUUM ARC DEPOSITION; OPTICAL BAND GAP; WURTZITE;

THIN FILMS;

EID: 33745485676     PISSN: 09538984     EISSN: 1361648X     Source Type: Journal    
DOI: 10.1088/0953-8984/18/27/021     Document Type: Article

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