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Volumn 507, Issue 1, 2010, Pages 184-189

Electrical characterization and device characterization of ZnO microring shaped films by sol-gel method

Author keywords

Nanoparticles; Schottky diode; Sol gel; ZnO

Indexed keywords

AFM; BARRIER HEIGHTS; CURRENT VOLTAGE; DEVICE CHARACTERIZATION; ELECTRIC PARAMETERS; ELECTRICAL CHARACTERIZATION; HEXAGONAL WURTZITE; IDEALITY FACTORS; IMPEDANCE SPECTROSCOPY; INNER DIAMETERS; INTERFACE STATE DENSITY; KUBELKA-MUNK; MICRORINGS; N TYPE SILICON; N VALUE; OUTER DIAMETERS; POLYCRYSTALLINE; REFLECTANCE SPECTRUM; SCHOTTKY DIODES; SERIES RESISTANCES; SILICON SUBSTRATES; SINGLE PHASE; SOL-GEL METHODS; XRD ANALYSIS; ZNO; ZNO FILMS;

EID: 77956613380     PISSN: 09258388     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jallcom.2010.07.151     Document Type: Article
Times cited : (175)

References (45)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.