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Volumn 496, Issue 2, 2006, Pages 234-239

Low temperature photoluminescence and infrared dielectric functions of pulsed laser deposited ZnO thin films on silicon

(11) Heitsch, S a Bundesmann, C a Wagner, G a Zimmermann, G a Rahm, A a Hochmuth, H a Benndorf, G a Schmidt, H a Schubert, M a Lorenz, M a Grundmann, M a

a UNIVERSITY OF LEIPZIG (Germany)

Author keywords

Infrared ellipsometry; Luminescence; Pulsed laser deposition; Thin films; Zinc oxide

Indexed keywords

DIELECTRIC MATERIALS; ELLIPSOMETRY; EXCITONS; FILM GROWTH; INFRARED RADIATION; LOW TEMPERATURE EFFECTS; LUMINESCENCE; PHONONS; PHOTOLUMINESCENCE; PULSED LASER DEPOSITION; SILICON; SPECTROSCOPIC ANALYSIS; THIN FILMS;

DONOR-ACCEPTOR PAIR TRANSITIONS; INFRARED ELLIPSOMETRY; PHONON MODES; SPECTROSCOPIC ELLIPSOMETRY;

ZINC OXIDE;

EID: 28044472286 PISSN: 00406090 EISSN: None Source Type: Journal
DOI: 10.1016/j.tsf.2005.08.305 Document Type: Article

Times cited : (26)

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