Experimental and theoretical analysis of transport properties of core-shell wire light emitting diodes probed by electron beam induced current microscopy

Nanotechnology

Volumn 25, Issue 25, 2014, Pages

  Lavenus, P ^a   Messanvi, A ^a,b   Rigutti, L ^c   De Luna Bugallo, A ^a   Zhang, H ^a   Bayle, F ^a   Julien, F H ^a   Eymery, J ^b   Durand, C ^b   Tchernycheva, M ^a  

^a UNIVERSITÉ PARIS SACLAY   (France)

^b UNIV GRENOBLE ALPES   (France)

^c UNIVERSITÉ DE ROUEN   (France)

Author keywords

Coreshell heterostructure; Electron beam induced current; Light emitting diode; Nitride nanowire; Transport

Indexed keywords

BIAS VOLTAGE; ELECTRON BEAM LITHOGRAPHY; LIGHT EMITTING DIODES; NANOWIRES; SEMICONDUCTOR JUNCTIONS; SHELLS (STRUCTURES); WIRE;

CORE-SHELL HETEROSTRUCTURE; CURRENT REDISTRIBUTION; ELECTRON-BEAM-INDUCED CURRENT; ELECTRON-BEAM-INDUCED CURRENT MICROSCOPY; EXPERIMENTAL PARAMETERS; INFORMATION CONCERNING; THEORETICAL INVESTIGATIONS; TRANSPORT;

ELECTRIC CURRENTS;

EID: 84901989736     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/25/25/255201     Document Type: Article

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