Size-dependent photoconductivity in MBE-grown GaN - Nanowires

Nano Letters

Volumn 5, Issue 5, 2005, Pages 981-984

  Calarco, Raffaella ^a   Marso, Michel ^a   Richter, Thomas ^a   Aykanat, Ali I ^a   Meijers, Ralph ^a   Hart, André V D ^a   Stoica, Toma ^a   Luth, Hans ^a  

^a FORSCHUNGSZENTRUM JÜLICH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT VOLTAGE CHARACTERISTICS; FERMI LEVEL; GALLIUM NITRIDE; METALLIZING; MOLECULAR BEAM EPITAXY; PERMITTIVITY; PHOTOCONDUCTIVITY; PHOTOCURRENTS; PHOTOEMISSION; ULTRAVIOLET RADIATION; X RAY PHOTOELECTRON SPECTROSCOPY;

ELECTRICAL TRANSPORT; NANOWHISKERS; SPACE CHARGES; SURFACE FERMI-LEVEL PINNING;

NANOSTRUCTURED MATERIALS;

GALLIUM; GALLIUM NITRIDE; NANOMATERIAL;

ARTICLE; CHEMISTRY; CRYSTALLIZATION; ELECTRIC CONDUCTIVITY; ELECTRICITY; ELECTROCHEMISTRY; ELECTRON; EVALUATION; INSTRUMENTATION; METHODOLOGY; NANOTECHNOLOGY; PARTICLE SIZE; PHOTOCHEMISTRY; RADIATION EXPOSURE; ULTRASTRUCTURE;

CRYSTALLIZATION; ELECTRIC CONDUCTIVITY; ELECTRIC WIRING; ELECTROCHEMISTRY; ELECTRONS; GALLIUM; NANOSTRUCTURES; NANOTECHNOLOGY; PARTICLE SIZE; PHOTOCHEMISTRY;

EID: 19944366262     PISSN: 15306984     EISSN: None     Source Type: Journal    
DOI: 10.1021/nl0500306     Document Type: Article

References (21)

1. Lauhon, L.; Gudiksen, M.; Wang, D.; Lieber, C. Nature 2002, 420, 57.
2. Gudiksen, M.; Lauhon, L.; Wang, J.; Smith, D.; Lieber, C. Nature 2002, 415, 617.
3. Wang, J.; Gudiksen, M.; Duan, X.; Cui, Y.; Lieber, C. Science 2001, 293, 1455.
4. Hiruma, K.; Yazawa, M.; Haraguchi, K.; Ogawa, K.; Katsuyama, T.; Koguchi, M.; Kakibayashi, H. J. Appl. Phys. 1993, 74, 3162.
5. Ohlsson, B.; Björk, M.; Magnusson, M.; Deppert, K.; Samuelson, L.; Wallenberg, L. Appl. Phys. Lett. 2001, 79, 3335.
6. Ohlsson, B.; Björk, M.; Persson, A.; Thelander, C.; Wallenberg, L.; Magnusson, M.; Deppert, K.; Samuelson, L. Physica E 2002, 13, 1126.
7. Sánchez-Páramo, J.; Calleja, J.; Sánchez-Garcia, M.; Calleja, E.; Jahn, U. Physica E 2002, 13, 1070.
8. Calleja, E.; Sánchez-Garcia, M.; Sánchez, F.; Calle, F.; Naranjo, F.; Muñoz, E.; Jahn, U.; Ploog, K. Phys. Rev. B 2000, 62, 16826.
9. Ristic, J.; Calleja, E.; Sánchez-Garcia, M.; Ulloa, J.; Sánchez-Páramo, J.; Calleja, J.; Jahn, U.; Trampert, A.; Ploog, K. Phys. Rev. B 2003, 68, 125305.
10. Thelander, C.; Maårtensson, T.; Björk, M.; Ohlsson, B.; Larsson, M.; Wallenberg, L.; Samuelson, L. Appl. Phys. Lett. 2003, 83, 2052.
11. Greytak, A.; Lauhon, L.; Gudiksen, M.; Lieber, C. Appl. Phys. Lett. 2004, 84, 4176.
12. Duan, X.; Huang, Y.; Agarwal, R.; Lieber, C. Nature 2003, 421, 241.
13. Zhong, Z.; Wang, D.; Cui, Y.; Bockrath, M.; Lieber, C. Science 2003, 302, 1377.
14. Björk, M.; Ohlsson, B.; Thelander, C.; Persson, A.; Deppert, K.; Wallenberg, L.; Samuelson, L. Appl Phys. Lett. 2002, 81, 4458.
15. Björk, M.; Ohlsson, B.; Sass, T.; Persson, A.; Thelander, C.; Magnusson, M.; Deppert, K.; Wallenberg, L.; Samuelson, L. Appl. Phys. Lett. 2002, 80, 1058.
16. Lüth, H. Solid Surfaces, Interfaces and Thin Films, 4th ed.; Springer: Berlin, Heidelberg, 2001; Chapter 7.
17. Calarco, R.; Marso, M.; Meijers, R.; Richter, T.; Aykanat, A. I.; Stoica, T.; Lüth, H. Proceedings of the ASDAM '04 Conference, Smolenice, Slovakia, 2004, 9.
18. Han, S.; Jin, W.; Zhang, D.; Tang, T.; Li, C.; Liu, X.; Liu, Z.; Lei, B.; Zhou, C. Chem. Phys. Lett. 2004, 389, 176.
19. Schmitz, A. C.; Ping, A. T.; Khan, M. A.; Chen, Q.; Yang, J. W.; Adesida, I. Semicond. Sci. Technol. 1996, 11, 1464.
20. Rose, A. Phys. Rev. 1955, 97, 1538.
21. Kočan, M.; Rizzi, A.; Lüth, H.; Keller, S.; Mishra, U. K. Phys. Status Solidi B 2002, 234, 773.