Early-life-failure detection using SAT-based ATPG

Proceedings - International Test Conference

Volumn , Issue , 2013, Pages

  Sauer, Matthias ^a   Kim, Young Moon ^b   Seomun, Jun ^c   Kim, Hyung Ock ^c   Do, Kyung Tae ^c   Choi, Jung Yun ^c   Kim, Kee Sup ^c   Mitra, Subhasish ^b   Becker, Bernd ^a  

^a UNIVERSITY OF FREIBURG   (Germany)

^b STANFORD UNIVERSITY   (United States)

^c SAMSUNG Electronics   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

BIAS TEMPERATURE INSTABILITY; FUNCTIONAL FAILURE; INTERNAL NODES; MANUFACTURING TESTS; PATH DELAY FAULT; PRODUCT LIFETIME; SAT-BASED ATPG; TRANSITION FAULTS;

EID: 84891552914     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/TEST.2013.6651925     Document Type: Conference Paper

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