An experiment of burn-in time reduction based on parametric test analysis

Proceedings - International Test Conference

Volumn , Issue , 2012, Pages

  Sumikawa, Nik ^a   Wang, Li C ^a   Abadir, Magdy S ^b  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b FREESCALE SEMICONDUCTOR INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

3-AXIS ACCELEROMETER; BURN-IN; BURN-IN TIME; COST SAVING; PARAMETRIC TEST; TEST DATA; TEST MODELS; WORK STUDY;

EXPERIMENTS;

EID: 84873202875     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/TEST.2012.6401595     Document Type: Conference Paper

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