SHOrt Voltage Elevation (SHOVE) test for weak CMOS ICs

Proceedings of the IEEE VLSI Test Symposium

Volumn , Issue , 1997, Pages 446-451

  Chang, Jonathan T Y ^a   McCluskey, Edward J ^a  

^a STANFORD UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; ELECTRIC VARIABLES MEASUREMENT; LOGIC GATES; OXIDES; VECTORS;

SHORT VOLTAGE ELEVATION (SHOVE); STRESS VOLTAGE;

INTEGRATED CIRCUIT TESTING;

EID: 0030651768     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (34)