Successful development and implementation of statistical outlier techniques on 90NM and 65NM process driver devices

IEEE International Reliability Physics Symposium Proceedings

Volumn , Issue , 2006, Pages 552-559

  Butler, Kenneth M ^a   Subramaniam, Suresh ^a   Nahar, Amit ^a   Carulli Jr , John M ^a   Anderson, Thomas J ^a   Daasch, W Robert ^b  

^a TEXAS INSTRUMENTS   (United States)

^b Portland State University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DRIVER DEVICES; NONPARAMETRIC STATISTICS; OUTLIERS;

ERROR ANALYSIS; LEAKAGE CURRENTS; STATISTICS;

INTEGRATED CIRCUIT MANUFACTURE;

EID: 34250705286     PISSN: 15417026     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/RELPHY.2006.251278     Document Type: Conference Paper

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