Reducing burn-in time through high-voltage stress test and weibull statistical analysis

IEEE Design and Test of Computers

Volumn 23, Issue 2, 2006, Pages 88-98

  Zakaria, Mohd Fairuz ^a   Abu Kassim, Zainal ^a   Ooi, Melanie Po Leen ^b   Demidenko, Serge ^b  

^a FREESCALE SEMICONDUCTOR INC   (United States)

^b MONASH UNIVERSITY   (Australia)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC POTENTIAL; INTEGRATED CIRCUIT MANUFACTURE; STATISTICAL METHODS; WEIBULL DISTRIBUTION;

BURN-IN TIME; HIGH-VOLTAGE STRESS TEST; WEIBULL STATISTICAL ANALYSIS;

INTEGRATED CIRCUIT TESTING;

EID: 33645812150     PISSN: 07407475     EISSN: None     Source Type: Journal    
DOI: 10.1109/MDT.2006.50     Document Type: Article

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