Gate-oxide early life failure prediction

Proceedings of the IEEE VLSI Test Symposium

Volumn , Issue , 2008, Pages 111-118

  Tze, Wee Chen ^a   Kyunglok, Kim ^a   Young, Moon Kim ^a   Mitra, Subhasish ^a  

^a STANFORD UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CIRCUIT SIMULATIONS; GATE OXIDES; VLSI TESTS;

CIRCUIT SIMULATION; COMPUTER NETWORKS; DIGITAL ARITHMETIC; DIGITAL INTEGRATED CIRCUITS;

CMOS INTEGRATED CIRCUITS;

EID: 51449105667     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/VTS.2008.55     Document Type: Conference Paper

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