Hard X-Ray nanofocusing with refractive X-ray optics: Full beam characterization by ptychographic imaging

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 8848, Issue , 2013, Pages

  Schroer, Christian G ^a   Brack, Florian Emanuel ^a   Brendler, Roman ^a   Hönig, Susanne ^a   Hoppe, Robert ^a   Patommel, Jens ^a   Ritter, Stephan ^a   Scholz, Maria ^a   Schropp, Andreas ^a   Seiboth, Frank ^a   Nilsson, Daniel ^b   Rahomäki, Jussi ^b   Uhlén, Fredrik ^b   Vogt, Ulrich ^b   Reinhardt, Juliane ^c   Falkenberg, Gerald ^c  

^a DRESDEN UNIVERSITY OF TECHNOLOGY   (Germany)

^b ROYAL INSTITUTE OF TECHNOLOGY   (Sweden)

^c DESY   (Germany)

Author keywords

Beam characterization; Hard x ray nanobeam; Nanofocusing refractive x ray lenses; Ptychography

Indexed keywords

BEAM CHARACTERIZATION; COHERENT DIFFRACTION IMAGING; DIFFRACTION-LIMITED BEAMS; NANO BEAMS; NANOFOCUSING REFRACTIVE X-RAY LENS; NUMERICAL APERTURE; PTYCHOGRAPHY; REFRACTIVE X-RAY LENS;

NANOWIRES; OPTICAL INSTRUMENT LENSES; X RAY LITHOGRAPHY;

X RAYS;

EID: 84888882538     PISSN: 0277786X     EISSN: 1996756X     Source Type: Conference Proceeding    
DOI: 10.1117/12.2024127     Document Type: Conference Paper

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