Characterization of high-resolution diffractive X-ray optics by ptychographic coherent diffractive imaging

Optics Express

Volumn 19, Issue 22, 2011, Pages 21333-21344

  Vila Comamala, Joan ^a,d   Diaz, Ana ^a   Guizar Sicairos, Manuel ^a   Mantion, Alexandre ^b   Kewish, Cameron M ^c   Menzel, Andreas ^a   Bunk, Oliver ^a   David, Christian ^a  

^a PAUL SCHERRER INSTITUTE   (Switzerland)

^b BAM FEDERAL INSTITUTE FOR MATERIALS RESEARCH AND TESTING   (Germany)

^c SYNCHROTRON SOLEIL   (France)

^d ARGONNE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ABERRATIONS; COHERENT SCATTERING; OPTICS; WAVEFRONTS;

DIFFRACTIVE IMAGING; EXIT PUPIL; FOCAL SPOT; FRESNEL ZONE PLATE; HIGH RESOLUTION; NON-LINEAR OPTIMIZATION; PHASE RETRIEVAL ALGORITHM; PHOTON ENERGY; RECONSTRUCTED IMAGE; ROOT MEAN SQUARE ERRORS; SCATTERING OBJECTS; SPATIAL RESOLUTION; WAVEFIELDS; WAVEFRONT ABERRATIONS; X RAY LENS; X-RAY WAVEFRONTS;

X RAYS;

EID: 80054963171     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.19.021333     Document Type: Article

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