Hard x-ray scanning microscopy with coherent radiation: Beyond the resolution of conventional x-ray microscopes

Applied Physics Letters

Volumn 100, Issue 25, 2012, Pages

  Schropp, A ^a   Hoppe, R ^a   Patommel, J ^a   Samberg, D ^a   Seiboth, F ^a   Stephan, S ^a   Wellenreuther, G ^b   Falkenberg, G ^b   Schroer, C G ^a  

^a DRESDEN UNIVERSITY OF TECHNOLOGY   (Germany)

^b DESY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

COHERENT DIFFRACTION; COHERENT RADIATION; FLUENCES; HARD X RAY; NUMERICAL APERTURE; OPTIMAL PROBE; RESOLUTION LIMITS; SPATIAL RESOLUTION; STRUCTURE FACTORS; X RAY SCANNING;

IMAGE RESOLUTION; X RAY MICROSCOPES;

X RAYS;

EID: 84863316025     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4729942     Document Type: Article

References (28)

1. E. Zschech, R. Huebner, D. Chumakov, O. Aubel, D. Friedrich, P. Guttmann, S. Heim, and G. Schneider, J. Appl. Phys. 106, 093711 (2009). 10.1063/1.3254166
2. J.-D. Grunwaldt and C. G. Schroer, Chem. Soc. Rev. 39, 4741 (2010). 10.1039/c0cs00036a
3. Proceedings of the 10th International Conference on X-Ray Microscopy, AIP Conference Series Vol. 1365, edited by, I. McNulty, C. Eyberger, and, B. Lai, (AIP, Melville, 2011).
4. C. G. Schroer, O. Kurapova, J. Patommel, P. Boye, J. Feldkamp, B. Lengeler, M. Burghammer, C. Riekel, L. Vincze, A. van der Hart, and M. Küchler, Appl. Phys. Lett. 87, 124103 (2005). 10.1063/1.2053350
5. H. C. Kang, J. Maser, G. B. Stephenson, C. Liu, R. Conley, A. T. Macrander, and S. Vogt, Phys. Rev. Lett. 96, 127401 (2006). 10.1103/PhysRevLett. 96.127401
6. J. Vila-Comamala, A. Diaz, M. Guizar-Sicairos, A. Mantion, C. M. Kewish, A. Menzel, O. Bunk, and C. David, Opt. Express 19, 21333 (2011). 10.1364/OE.19.021333
7. O. Hignette, P. Cloetens, G. Rostaing, P. Bernard, and C. Morawe, Rev. Sci. Instrum. 76, 063709 (2005); 10.1063/1.1928191
8. Y. S. Chu, J. M. Yi, F. De Carlo, Q. Shen, W.-K. Lee, H. J. Wu, C. L. Wang, J. Y. Wang, C. J. Liu, C. H. Wang, S. R. Wu, C. C. Chien, Y. Hwu, A. Tkachuk, W. Yun, M. Feser, K. S. Liang, C. S. Yang, J. H. Je, and G. Margaritondo, Appl. Phys. Lett. 92, 103119 (2008); 10.1063/1.2857476
9. H. Mimura, S. Handa, T. Kimura, H. Yumoto, D. Yamakawa, H. Yokoyama, S. Matsuyama, K. Inagaki, K. Yamamura, Y. Sano, K. Tamasaku, Y. Nishino, M. Yabashi, T. Ishikawa, and K. Yamauchi, Nat. Phys. 6, 122 (2010). 10.1038/nphys1457
10. J. M. Rodenburg and H. M. L. Faulkner, Appl. Phys. Lett. 85, 4795 (2004); 10.1063/1.1823034
11. H. M. L. Faulkner and J. M. Rodenburg, Phys. Rev. Lett. 93, 023903 (2004). 10.1103/PhysRevLett.93.023903
12. J. M. Rodenburg, A. C. Hurst, A. G. Cullis, B. R. Dobsen, F. Pfeiffer, O. Bunk, C. David, K. Jefimovs, and I. Johnson, Phys. Rev. Lett. 98, 034801 (2007); 10.1103/PhysRevLett.98.034801
13. P. Thibault, M. Dierolf, A. Menzel, O. Bunk, C. David, and F. Pfeiffer, Science 321, 379 (2008). 10.1126/science.1158573
14. P. Thibault, M. Dierolf, O. Bunk, A. Menzel, and F. Pfeiffer, Ultramicroscopy 109, 338 (2009); 10.1016/j.ultramic.2008.12.011
15. A. M. Maiden and J. M. Rodenburg, Ultramicroscopy 109, 1256 (2009). 10.1016/j.ultramic.2009.05.012
16. A. Schropp, P. Boye, J. M. Feldkamp, R. Hoppe, J. Patommel, D. Samberg, S. Stephan, K. Giewekemeyer, R. N. Wilke, T. Salditt, J. Gulden, A. P. Mancuso, I. A. Vartanyants, E. Weckert, S. Schöder, M. Burghammer, and C. G. Schroer, Appl. Phys. Lett. 96, 091102 (2010); 10.1063/1.3332591
17. C. M. Kewish, M. Guizar-Sicairos, C. Liu, J. Qian, B. Shi, C. Benson, A. M. Khounsary, J. Vila-Comamala, O. Bunk, J. R. Fienup, A. T. Macrander, and L. Assoufid, Opt. Express 18, 23420 (2010); 10.1364/OE.18.023420
18. C. M. Kewish, P. Thibault, M. Dierolf, O. Bunk, A. Menzel, J. Vila-Comamala, K. Jefimovs, and F. Pfeiffer, Ultramicroscopy 110, 325 (2010); 10.1016/j.ultramic.2010.01.004
19. S. Hönig, R. Hoppe, J. Patommel, A. Schropp, S. Stephan, S. Schöder, M. Burghammer, and C. G. Schroer, Opt. Express 19, 16325 (2011). 10.1364/OE.19.016324
20. A. Schropp, P. Boye, A. Goldschmidt, S. Hönig, R. Hoppe, J. Patommel, C. Rakete, D. Samberg, S. Stephan, S. Schöder, M. Burghammer, and C. G. Schroer, J. Microscopy 241, 9 (2011). 10.1111/j.1365-2818.2010.03453.x
21. M. Dierolf, A. Menzel, P. Thibault, P. Schneider, C. M. Kewish, R. Wepf, O. Bunk, and F. Pfeiffer, Nature (London) 467, 436 (2010); 10.1038/nature09419
22. A. Diaz, P. Trtik, M. Guizar-Sicairos, A. Menzel, P. Thibault, and O. Bunk, Phys. Rev. B 85, 020104(R) (2012). 10.1103/PhysRevB.85.020104
23. Y. Takahashi, A. Suzuki, N. Zettsu, Y. Kohmura, Y. Senba, H. Ohashi, K. Yamauchi, and T. Ishikawa, Phys. Rev. B 83, 214109 (2011). 10.1103/PhysRevB.83. 214109
24. A. Schropp and C. G. Schroer, New J. Phys. 12, 035016 (2010). 10.1088/1367-2630/12/3/035016
25. C. G. Schroer, P. Boye, J. Feldkamp, J. Patommel, A. Schropp, A. Schwab, S. Stephan, M. Burghammer, S. Schöder, and C. Riekel, Phys. Rev. Lett. 101, 090801 (2008); 10.1103/PhysRevLett.101.090801
26. Y. Takahashi, Y. Nishino, R. Tsutsumi, H. Kubo, H. Furukawa, H. Mimura, S. Matsuyama, N. Zettsu, E. Matsubara, T. Ishikawa, and K. Yamauchi, Phys. Rev. B 80, 054103 (2009). 10.1103/PhysRevB.80.054103
27. C. G. Schroer, P. Boye, J. M. Feldkamp, J. Patommel, D. Samberg, A. Schropp, A. Schwab, S. Stephan, G. Falkenberg, G. Wellenreuther, and N. Reimers, Nucl. Instrum. Methods Phys. Res. A 616, 93 (2010). 10.1016/j.nima.2009.10.094
28. C. G. Schroer, M. Kuhlmann, U. T. Hunger, T. F. Günzler, O. Kurapova, S. Feste, F. Frehse, B. Lengeler, M. Drakopoulos, A. Somogyi, A. S. Simionovici, A. Snigirev, I. Snigireva, C. Schug, and W. H. Schröder, Appl. Phys. Lett. 82, 1485 (2003). 10.1063/1.1556960