Scanning Near-Field Optical Microscopy (SNOM)

Surface and Thin Film Analysis: A Compendium of Principles, Instrumentation, and Applications, Second Edition

Volumn , Issue , 2011, Pages 481-497

  Richter, Marc ^a   Deckert, Volker ^a,b  

^a LEIBNIZ INSTITUTE OF PHOTONIC TECHNOLOGY   (Germany)

^b FRIEDRICH SCHILLER UNIVERSITY JENA   (Germany)

Author keywords

Atomic force microscopy; Near field applications; Near field microscopy; Scanning near field optical microscopy; Tip fabrication

Indexed keywords

EID: 84886462223     PISSN: None     EISSN: None     Source Type: Book    
DOI: 10.1002/9783527636921.ch31     Document Type: Chapter

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