Observation of localized optical near-field generated by submicron two-hole structure for novel SNOM probe

Surface and Interface Analysis

Volumn 40, Issue 6-7, 2008, Pages 1054-1058

  Oshikane, Yasushi ^a   Hara, Seiji ^a   Matsuda, Takuya ^a   Inoue, Haruyuki ^a   Nakano, Motohiro ^a   Kataoka, Toshihiko ^a  

^a OSAKA UNIVERSITY   (Japan)

Author keywords

Focused ion beam (FIB); Optical fiber; Plasmon; Scanning near field optical microscopy (SNOM); Two hole structure

Indexed keywords

ARSENIC COMPOUNDS; BOUNDARY ELEMENT METHOD; FABRICATION; FIBER OPTICS; FOCUSED ION BEAMS; IMAGING TECHNIQUES; ION BOMBARDMENT; METALLIZING; NUMERICAL ANALYSIS; OPTICAL DESIGN; OPTICAL FIBER FABRICATION; OPTICAL FIBERS; OPTICAL MICROSCOPY;

BOUNDARY ELEMENT METHOD (BEM); FINE STRUCTURES; FOCUSED ION BEAM (FIB) MILLING; INTENSE (CO); NOVEL CONCEPT; OPTICAL (PET) (OPET); OPTICAL NEAR FIELDS; PROBE TIPS; SCANNING NEAR FIELD OPTICAL MICROSCOPY (SNOM); SUB MICROMETERS; SUB MICRONS;

NEAR FIELD SCANNING OPTICAL MICROSCOPY;

EID: 47749123800     PISSN: 01422421     EISSN: 10969918     Source Type: Journal    
DOI: 10.1002/sia.2830     Document Type: Conference Paper

References (4)

1. Novotny L, Hecht B. Principles of Nano-optics (1st edn). Cambridge University Press: New York, 2006.
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3. Kataoka T, Endo K, Oshikane Y, Inoue H, Inagaki K, Mori Y, An H, Kobayakawa O, Izumi A. Ultramicroscopy 1996; 63(3-4): 219.
4. Oshikane Y, Kataoka T, Okuda M, Hara S, Inoue H, Nakano M. Sci. Technol. Adv. Mater. 2007; 8(3): 181.