Surface enhanced infrared absorption observed with attenuated total reflection (ATR-SEIRA): Modeling the optical response

Fresenius' Journal of Analytical Chemistry

Volumn 362, Issue 1, 1998, Pages 51-57

  Roseler A ^a   Korte, E H ^a  

^a LEIBNIZ INSTITUT FÜR ANALYTISCHE WISSENSCHAFTEN ISAS E V   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0002759717     PISSN: 09370633     EISSN: None     Source Type: Journal    
DOI: 10.1007/s002160051034     Document Type: Article

References (17)

1. Hartstein A, Kirtley JR, Tsang JC (1980) Phys Rev Lett 45:201
2. Hatta A, Suzuki Y, Suetaka W (1984) Appl Phys A 35:135
3. Osawa M, Ataka K, Yoshii K, Nishikawa Y (1993) Appl Spectrosc 47:1497
4. Nishikawa Y, Fujiwara K, Ataka D, Osawa M (1993) Anal Chem 65:556
5. Johnson SA, Pham NH, Novick VJ, Maroni VA (1997) Appl Spectrosc 51:1423
6. Wanzenböck HD, Mizaikoff B, Weissenbacher N, Kellner R (1997) J Mol Struct 410/411:535
7. Wanzenböck HD, Edl-Mizaikoff B, Friedbacher G, Grasserbauer M, Kellner R, Arntzen M, Luyven T, Theiss W, Grosse P (1997) Mikrochim Acta Suppl 14:665
8. Röseler A, Korte EH (1997) Appl Spectrosc 51:902
9. Röseler A, Korte EH (1998) Thin Solid Films (in press)
10. Lynch DW, Hunter WR (1985) In: Palik ED (ed) Handbook of Optical Constants of Solids. Academic Press, Orlando/FL, USA, p 286
11. Aspnes DE (1985) In: Palik ED (ed) Handbook of Optical Constants of Solids. Academic Press, Orlando/FL, USA, p 104
12. Bruggeman DAG (1935) Ann Phys 24:636
13. Röseler A, Korte EH (1998) In: de Haseth JA (ed) 11th International Conference on Fourier Spectroscopy, a Conference Proceeding. AIP, Woodbury/NY, USA (in press)
14. Stoner EC (1945) Philos Mag 7:803
15. Eagan CF (1981) Appl Optics 20:3035
16. den Engelsen D (1971) J Opt Soc Amer 61:1460
17. Azzam RMA, Beshara NM (1977) Ellipsometry and Polarized Light. North-Holland, Amsterdam, Netherlands