Prediction of sublayer depth in turbid media using spatially offset Raman spectroscopy

Analytical Chemistry

Volumn 80, Issue 21, 2008, Pages 8146-8152

  Macleod, N A ^a   Goodship, A ^b   Parker, A W ^a   Matousek, P ^a  

^a Harwell Science and Innovation Campus   (United Kingdom)

^b ROYAL NATIONAL ORTHOPAEDIC HOSPITAL   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

DECISION MAKING; RAMAN SCATTERING; RAMAN SPECTROSCOPY; SPECTRUM ANALYSIS; THREE DIMENSIONAL; TURBIDITY;

DEEP PENETRATIONS; DEPTH INFORMATIONS; MULTIVARIATE ANALYSES; MULTIVARIATE TECHNIQUES; OPTICALLY THICK LAYERS; PARAFAC; PARALLEL FACTOR ANALYSES; RELATIVE ACCURACIES; TURBID MEDIAS; TWO-DIMENSIONAL ANALYSES;

MULTIVARIANT ANALYSIS;

ACCURACY; ARTICLE; CULTURE MEDIUM; FACTORIAL ANALYSIS; MULTIVARIATE ANALYSIS; PREDICTION; RAMAN SPECTROMETRY; TURBIDITY;

NEPHELOMETRY AND TURBIDIMETRY; SPECTRUM ANALYSIS, RAMAN;

EID: 55549103339     PISSN: 00032700     EISSN: None     Source Type: Journal    
DOI: 10.1021/ac801219a     Document Type: Article

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