Influence of the water layer on the shear force damping in near-field microscopy

Applied Physics Letters

Volumn 73, Issue 18, 1998, Pages 2594-2596

  Davy, S ^a   Spajer, M ^a   Courjon, D ^a  

^a UNIVERSITÉ DE FRANCHE COMTÉ   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ATMOSPHERIC HUMIDITY; ATOMIC FORCE MICROSCOPY; DAMPING; OPTICAL VARIABLES MEASUREMENT; SCANNING; WATER;

REFLECTION NEAR FIELD MICROSCOPE; SHEAR FORCE DAMPING; SHEAR FORCE DETECTION; WATER LAYER;

SHEAR FLOW;

EID: 0032476434     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.122516     Document Type: Article

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