Raman measurements of uniaxial strain in silicon nanostructures

Journal of Applied Physics

Volumn 114, Issue 14, 2013, Pages

  Ureña, Ferran ^a   Olsen, Sarah H ^a   Raskin, Jean Pierre ^b  

^a NEWCASTLE UNIVERSITY   (United Kingdom)

^b UNIVERSITÉ CATHOLIQUE DE LOUVAIN   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

ANALYTICAL CALCULATION; DEFORMATION POTENTIAL; FINITE ELEMENT SIMULATIONS; LONGITUDINAL OPTICAL; SCATTERING GEOMETRIES; SILICON NANO STRUCTURES; STATE-OF-THE-ART DEVICES; SURFACE ORIENTATION;

LASER RADIATION; NANOWIRES; SCANNING ELECTRON MICROSCOPY;

SILICON;

EID: 84885993066     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4824291     Document Type: Article

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