On the size-dependent elasticity of silicon nanocantilevers: Impact of defects

Journal of Physics D: Applied Physics

Volumn 44, Issue 7, 2011, Pages

  Sadeghian, Hamed ^a,b   Goosen, Hans ^a   Bossche, Andre ^b   Thijsse, Barend ^b   Van Keulen, Fred ^a  

^a DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

^b DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

CONTINUUM THEORY; DEFECT-FREE; ELASTIC BEHAVIOUR; EXPERIMENTAL MEASUREMENTS; INDUCED DEFECTS; NANOPLATES; NATIVE OXIDE LAYER; ORIENTED SILICON; SURFACE EFFECT; SURFACE STRESS EFFECTS; THEORETICAL MODELS; YOUNG'S MODULUS;

CONTINUUM MECHANICS; ELASTICITY; MOLECULAR DYNAMICS; NANOCANTILEVERS; NANOSTRUCTURED MATERIALS; NANOWIRES;

SURFACE DEFECTS;

EID: 79751494948     PISSN: 00223727     EISSN: 13616463     Source Type: Journal    
DOI: 10.1088/0022-3727/44/7/072001     Document Type: Article

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