SCOPUS 정보 검색 플랫폼

Volumn 110, Issue 9, 2011, Pages

Validating Raman spectroscopic calibrations of phonon deformation potentials in silicon single crystals: A comparison between ball-on-ring and micro-indentation methods

(2) Miyatake, Takahiro a,b Pezzotti, Giuseppe a

a PANASONIC CORPORATION (Japan)

b KYOTO INSTITUTE OF TECHNOLOGY (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ANISOTROPIC EFFECTS; CALIBRATION METHOD; CLOSED-FORM EQUATIONS; CRYSTALLOGRAPHIC PLANE; DEFORMATION POTENTIAL; DEGREE OF PRECISION; ELASTIC COUPLING; EXPERIMENTAL STRESS ANALYSIS; MACROSCOPIC METHODS; MICRO INDENTATION; MICROSCOPIC METHODS; POLARIZED RAMAN SPECTROSCOPY; QUANTITATIVE COMPARISON; RAMAN SPECTROSCOPIC; RESIDUAL STRESS FIELDS; SILICON DEVICES; SILICON LATTICES; SILICON SINGLE CRYSTALS; STRESS FIELD; STRESS PROFILE; STRESS STATE;

BENDING (DEFORMATION); CALIBRATION; FINITE ELEMENT METHOD; PHONONS; RAMAN SPECTROSCOPY; STRESSES;

SINGLE CRYSTALS;

EID: 81355136184 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.3656447 Document Type: Article

Times cited : (17)

References (31)

1
- 0014700507
- 10.1016/0038-1098(70)90588-0
- E. Anastassakis, A. Pinczuk, E. Burstein, F. H. Pollak, and M. Cardona, Solid State Commun. 8, 133 (1970). 10.1016/0038-1098(70)90588-0
- (1970) Solid State Commun. , vol.8 , pp. 133
- Anastassakis, E.¹ Pinczuk, A.² Burstein, E.³ Pollak, F.H.⁴ Cardona, M.⁵

2
- 0000130088
- 10.1103/PhysRevB.17.1623
- M. Chandrasekhar, J. B. Renucci, and M. Cardona, Phys. Rev. B 17, 1623 (1978). 10.1103/PhysRevB.17.1623
- (1978) Phys. Rev. B , vol.17 , pp. 1623
- Chandrasekhar, M.¹ Renucci, J.B.² Cardona, M.³

3
- 0000699182
- 10.1103/PhysRevB.41.7529
- E. Anastassakis, A. Cantarero, and M. Cardona, Phys. Rev. B 41, 7529 (1990). 10.1103/PhysRevB.41.7529
- (1990) Phys. Rev. B , vol.41 , pp. 7529
- Anastassakis, E.¹ Cantarero, A.² Cardona, M.³

4
- 80955134259
- (in press). 10.1002/jrs.2953
- W. Zhu and G. Pezzotti, J. Raman Spectrosc. (in press). 10.1002/jrs.2953
- J. Raman Spectrosc.
- Zhu, W.¹ Pezzotti, G.²

5
- 6244244433
- 10.1103/PhysRevB.32.3966
- J. Menendez, L. Vina, M. Cardona, and E. Anastassakis, Phys. Rev. B 32, 3966 (1985). 10.1103/PhysRevB.32.3966
- (1985) Phys. Rev. B , vol.32 , pp. 3966
- Menendez, J.¹ Vina, L.² Cardona, M.³ Anastassakis, E.⁴

6
- 0030270485
- Raman determination of phonon deformation potentials in α-GaN
- DOI 10.1016/0038-1098(96)00410-3, PII S0038109896004103
- F. Demangeot, J. Frandon, M. A. Renucci, O. Briot, B. Gil, and R. L. Aulombard, Solid State Commun. 100, 207 (1996). 10.1016/0038-1098(96)00410-3 (Pubitemid 126370985)
- (1996) Solid State Communications , vol.100 , Issue.4 , pp. 207-210
- Demangeot, F.¹ Frandon, J.² Renucci, M.A.³ Briot, O.⁴ Gil, B.⁵ Aulombard, R.L.⁶

7
- 0000828113
- 10.1103/PhysRevB.5.580
- F. Cerdeira, C. J. Buchenauer, F. H. Pollak, and M. Cardona, Phys. Rev. B 5, 580 (1972). 10.1103/PhysRevB.5.580
- (1972) Phys. Rev. B , vol.5 , pp. 580
- Cerdeira, F.¹ Buchenauer, C.J.² Pollak, F.H.³ Cardona, M.⁴

8
- 0031237190
- 10.1063/1.366072
- S. Narayanan, S. R. Kalidindi, and L. S. Schadler, J. Appl. Phys. 82, 2595 (1997). 10.1063/1.366072
- (1997) J. Appl. Phys. , vol.82 , pp. 2595
- Narayanan, S.¹ Kalidindi, S.R.² Schadler, L.S.³

9
- 0039188221
- 10.1063/1.371670
- G. H. Loechelt, N. G. Cave, and J. Menendez, J. Appl. Phys. 86, 6164 (1999). 10.1063/1.371670
- (1999) J. Appl. Phys. , vol.86 , pp. 6164
- Loechelt, G.H.¹ Cave, N.G.² Menendez, J.³

10
- 0041922530
- 10.1063/1.1592872
- E. Bonera, M. Fanciulli, and D. N. Batchelder, J. Appl. Phys. 94, 2729 (2003). 10.1063/1.1592872
- (2003) J. Appl. Phys. , vol.94 , pp. 2729
- Bonera, E.¹ Fanciulli, M.² Batchelder, D.N.³

11
- 36849100800
- 10.1063/1.1711980
- S. P. S. Porto and R. S. Krishnan, J. Chem. Phys. 47, 1009 (1967). 10.1063/1.1711980
- (1967) J. Chem. Phys. , vol.47 , pp. 1009
- Porto, S.P.S.¹ Krishnan, R.S.²

12
- 36849141789
- 10.1063/1.1713863
- J. J. Wortman and R. A. Evans, J. Appl. Phys. 36, 153 (1965). 10.1063/1.1713863
- (1965) J. Appl. Phys. , vol.36 , pp. 153
- Wortman, J.J.¹ Evans, R.A.²

13
- 84918245251
- 10.1080/00018736400101051
- R. Loudon, Adv. Phys. 13, 442 (1964). 10.1080/00018736400101051
- (1964) Adv. Phys. , vol.13 , pp. 442
- Loudon, R.¹

14
- 0000736871
- 10.1063/1.361485
- I. De Wolf, H. E. Maes, and S. K. Jones, J. Appl. Phys. 79, 7148 (1996). 10.1063/1.361485
- (1996) J. Appl. Phys. , vol.79 , pp. 7148
- De Wolf, I.¹ Maes, H.E.² Jones, S.K.³

15
- 0002374579
- A. F. Kirstein and R. M. Woolley, J. Res. Natl. Bur. Stand. C 71, 1 (1967).
- (1967) J. Res. Natl. Bur. Stand. C , vol.71 , pp. 1
- Kirstein, A.F.¹ Woolley, R.M.²

16
- 0000970144
- F. F. Vitman and V. P. Pukh, Zavod. Lab. 29, 863 (1963).
- (1963) Zavod. Lab. , vol.29 , pp. 863
- Vitman, F.F.¹ Pukh, V.P.²

17
- 0024714265
- 10.1111/j.1151-2916.1989.tb07702.x
- G. de With and H. M. Wagemans, J. Am. Ceram. Soc. 72, 1538 (1989). 10.1111/j.1151-2916.1989.tb07702.x
- (1989) J. Am. Ceram. Soc. , vol.72 , pp. 1538
- De With, G.¹ Wagemans, H.M.²

18
- 0020192030
- 10.1080/01418618208236917
- E. H. Yoffe, Philos. Mag. A 46, 617 (1982). 10.1080/01418618208236917
- (1982) Philos. Mag. A , vol.46 , pp. 617
- Yoffe, E.H.¹

19
- 0003416922
- (Martinus Nijhoff Publishers, The Hague, The Netherlands)
- D. Broek, Elementary Engineering Fracture Mechanics (Martinus Nijhoff Publishers, The Hague, The Netherlands, 1982).
- (1982) Elementary Engineering Fracture Mechanics
- Broek, D.¹

20
- 67649556973
- 10.1063/1.3133197
- T. Miyatake, A. A. Porporati, and G. Pezzotti, J. Appl. Phys. 105, 113514 (2009). 10.1063/1.3133197
- (2009) J. Appl. Phys. , vol.105 , pp. 113514
- Miyatake, T.¹ Porporati, A.A.² Pezzotti, G.³

21
- 79955904484
- 10.1002/pssa.201000785
- G. Pezzotti, Phys. Status Solidi A 208, 976 (2011). 10.1002/pssa. 201000785
- (2011) Phys. Status Solidi A , vol.208 , pp. 976
- Pezzotti, G.¹

22
- 0019346684
- 10.1111/j.1151-2916.1981.tb09548.x
- D. K. Shetty, A. R. Rosenfield, G. K. Bansel, and W. H. Duckworth, J. Am. Ceram. Soc. 64, 1 (1981). 10.1111/j.1151-2916.1981.tb09548.x
- (1981) J. Am. Ceram. Soc. , vol.64 , pp. 1
- Shetty, D.K.¹ Rosenfield, A.R.² Bansel, G.K.³ Duckworth, W.H.⁴

23
- 0020589540
- 10.1111/j.1151-2916.1983.tb09964.x
- D. K. Shetty, A. R. Rosenfield, W. H. Duckworth, and P. R. Held, J. Am. Ceram. Soc. 66, 37 (1983). 10.1111/j.1151-2916.1983.tb09964.x
- (1983) J. Am. Ceram. Soc. , vol.66 , pp. 37
- Shetty, D.K.¹ Rosenfield, A.R.² Duckworth, W.H.³ Held, P.R.⁴

24
- 27644503075
- Stress distributions in thin bilayer discs subjected to ball-on-ring tests
- DOI 10.1111/j.1551-2916.2005.00343.x
- C. H. Hsueh, M. J. Lance, and M. K. Ferber, J. Am. Ceram. Soc. 88, 1687 (2005). 10.1111/j.1551-2916.2005.00343.x (Pubitemid 41557958)
- (2005) Journal of the American Ceramic Society , vol.88 , Issue.6 , pp. 1687-1690
- Hsueh, C.H.¹ Lance, M.J.² Ferber, M.K.³

25
- 79959262968
- 10.1016/j.jeurceramsoc.2011.05.009
- A. A. Porporati, T. Miyatake, K. Schilcher, W. Zhu, and G. Pezzotti, J. Eur. Ceram. Soc. 31, 2031 (2011). 10.1016/j.jeurceramsoc.2011.05.009
- (2011) J. Eur. Ceram. Soc. , vol.31 , pp. 2031
- Porporati, A.A.¹ Miyatake, T.² Schilcher, K.³ Zhu, W.⁴ Pezzotti, G.⁵

26
- 33748430376
- Measurement of biaxial stress states in silicon using micro-raman spectroscopy
- DOI 10.1115/1.2187527
- P. A. Gustafson, S. J. Harris, A. E. O'Neill, and A. M. Waas, J. Appl. Mech. 73, 745 (2006). 10.1115/1.2187527 (Pubitemid 44343275)
- (2006) Journal of Applied Mechanics, Transactions ASME , vol.73 , Issue.5 , pp. 745-751
- Gustafson, P.A.¹ Harris, S.J.² O'Neill, A.E.³ Waas, A.M.⁴

27
- 0030141309
- Small and large deformation of thick and thin-film multi-layers : Effects of layer geometry, plasticity and compositional gradients
- DOI 10.1016/0022-5096(96)84548-0, PII S00225096960000063
- M. Finot and S. Suresh, J. Mech. Phys. Solids 44, 683 (1996). 10.1016/0022-5096(96)84548-0 (Pubitemid 126359297)
- (1996) Journal of the Mechanics and Physics of Solids , vol.44 , Issue.5 , pp. 683-721
- Finot, M.¹ Suresh, S.²

28
- 36549098904
- 10.1063/1.342787
- K. Mizoguchi and S. Nakashima, J. Appl. Phys. 65, 2583 (1989). 10.1063/1.342787
- (1989) J. Appl. Phys. , vol.65 , pp. 2583
- Mizoguchi, K.¹ Nakashima, S.²

29
- 11044239189
- Measurement of the state of stress in silicon with micro-Raman spectroscopy
- DOI 10.1063/1.1808244, 7
- S. J. Harris, A. E. O'Neill, W. Yang, P. Gustafson, J. Boileau, W. H. Weber, B. Majumdar, and S. Ghosh, J. Appl. Phys. 96, 7195 (2004). 10.1063/1.1808244 (Pubitemid 40044405)
- (2004) Journal of Applied Physics , vol.96 , Issue.12 , pp. 7195-7201
- Harris, S.J.¹ O'Neill, A.E.² Yang, W.³ Gustafson, P.⁴ Boileau, J.⁵ Weber, W.H.⁶ Majumdar, B.⁷ Ghosh, S.⁸

30
- 0004296650
- 10.1107/S0021889882011704
- C. S. G. Cousin, L. Gerward, J. S. Olsen, B. Selsmark, and B. Sheldom, J. Appl. Crystallogr. 15, 154 (1982). 10.1107/S0021889882011704
- (1982) J. Appl. Crystallogr. , vol.15 , pp. 154
- Cousin, C.S.G.¹ Gerward, L.² Olsen, J.S.³ Selsmark, B.⁴ Sheldom, B.⁵

31
- 0023139031
- 10.1088/0022-3719/20/1/007
- C. S. G. Cousin, L. Gerward, J. S. Olsen, B. Selsmark, and B. Sheldom, J. Phys. C 20, 29 (1987). 10.1088/0022-3719/20/1/007
- (1987) J. Phys. C , vol.20 , pp. 29
- Cousin, C.S.G.¹ Gerward, L.² Olsen, J.S.³ Selsmark, B.⁴ Sheldom, B.⁵

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.