Probe integrated scattering cross sections in the analysis of atomic resolution HAADF STEM images

Ultramicroscopy

Volumn 133, Issue , 2013, Pages 109-119

  E, H ^a   MacArthur, K E ^a   Pennycook, T J ^a,b   Okunishi, E ^c   D'Alfonso, A J ^d   Lugg, N R ^d   Allen, L J ^d   Nellist, P D ^a,b  

^a UNIVERSITY OF OXFORD   (United Kingdom)

^b DARESBURY LABORATORY   (United Kingdom)

^c JEOL LTD   (Japan)

^d UNIVERSITY OF MELBOURNE   (Australia)

Author keywords

2D materials; Cross section; HAADF STEM; Quantification; Source coherence

Indexed keywords

CROSS SECTION; HAADF-STEM; HIGH-ANGLE ANNULAR DARK FIELDS; INTEGRATED CROSS SECTIONS; QUANTIFICATION; SCANNING TRANSMISSION ELECTRON MICROSCOPY; SCATTERING CROSS SECTION; SOURCE COHERENCE;

ATOMS; TRANSMISSION ELECTRON MICROSCOPY;

PROBES;

ANALYTIC METHOD; ANALYTICAL PARAMETERS; ARTICLE; ATOM; CALIBRATION; CATALYST; CCELERATING VOLTAGE; CHEMICAL ANALYSIS; CONTROLLED STUDY; DETECTOR ANGLE; ELECTRIC POTENTIAL; HIGH ANGLE ANNULAR DARK FIELD SCANNING TRANSMISSION ELECTRON MICROSCOPY; INTERMETHOD COMPARISON; MEASUREMENT; PROBE POSITION INTEGRATED CROSS SECTION; QUANTITATIVE ANALYSIS; SCANNING TRANSMISSION ELECTRON MICROSCOPY;

2D MATERIALS; CROSS SECTION; HAADF STEM; QUANTIFICATION; SOURCE COHERENCE;

CROSS-SECTIONAL STUDIES; MICROSCOPY, ELECTRON, SCANNING TRANSMISSION;

EID: 84882801688     PISSN: 03043991     EISSN: 18792723     Source Type: Journal    
DOI: 10.1016/j.ultramic.2013.07.002     Document Type: Article

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