Prospects of atomic resolution imaging with an aberrationcorrected STEM

Journal of Electron Microscopy

Volumn 50, Issue 4, 2001, Pages 291-305

  Ishizuka, K ^a  

^a Higashimatsuyama   (Japan)

Author keywords

Cs correction; Dynamical scattering; High angle annular dark field imaging; Image simulation; STEM

Indexed keywords

ARTICLE;

ABERRATIONS; COHERENT SCATTERING; DELTA FUNCTIONS; III-V SEMICONDUCTORS; IMAGE ENHANCEMENT; PROBES; TRANSMISSION ELECTRON MICROSCOPY;

ABERRATION-CORRECTED; ATOMIC-RESOLUTION IMAGING; CS-CORRECTION; DYNAMICAL SCATTERING; ELECTRON MICROSCOPE IMAGES; HIGH RESOLUTION SCANNING; HIGH-ANGLE ANNULAR DARK-FIELD IMAGING; IMAGES SIMULATIONS; PEAK-TO-BACKGROUND RATIOS; SCANNING TRANSMISSION ELECTRON MICROSCOPES;

FAST FOURIER TRANSFORMS;

EID: 0034810133     PISSN: 00220744     EISSN: None     Source Type: Journal    
DOI: 10.1093/jmicro/50.4.291     Document Type: Article

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