High angle dark field STEM for advanced materials

Journal of Electron Microscopy

Volumn 45, Issue 1, 1996, Pages 36-43

  Pennycook, S J ^a   Jesson, D E ^a   McGibbon, A J ^b   Nellist, P D ^a  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

^b UNIVERSITY OF GLASGOW   (United Kingdom)

Author keywords

Catalysts; EELS; Incoherent imaging; STEM; Z contrast

Indexed keywords

CATALYSTS; ELECTRON ENERGY LEVELS; ELECTRON SCATTERING; ENERGY DISSIPATION; IMAGE ENHANCEMENT; IMAGE RESOLUTION; TRANSMISSION ELECTRON MICROSCOPY;

ADVANCED MATERIALS; ANNULAR DETECTORS; DARK-FIELD; DIFFRACTED BEAMS; DIRECT INVERSION; INCOHERENT IMAGING; PHASE CORRELATION; SCANNING TRANSMISSION ELECTRON MICROSCOPES; Z CONTRASTS; ]+ CATALYST;

ELECTRON ENERGY LOSS SPECTROSCOPY;

EID: 4243081189     PISSN: 00220744     EISSN: None     Source Type: Journal    
DOI: 10.1093/oxfordjournals.jmicro.a023410     Document Type: Article

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