EELS in the TEM

Journal of Electron Spectroscopy and Related Phenomena

Volumn 143, Issue 2-3 SPEC. ISS., 2005, Pages 43-50

  Egerton, R F ^a   Malac, M ^a  

^a UNIVERSITY OF ALBERTA   (Canada)

Author keywords

EELS; ELNES; Radiation damage; Spectrometers; TEM

Indexed keywords

CAMERAS; CHARGE COUPLED DEVICES; DIODES; ELASTIC MODULI; ELECTRON SCATTERING; ENERGY DISPERSIVE SPECTROSCOPY; IMAGING TECHNIQUES; RADIATION DAMAGE; SILICON; SPECTROMETERS; TRANSMISSION ELECTRON MICROSCOPY; X RAY ANALYSIS;

CORE-LOSS SPECTROSCOPY; ELNES; ENERGY-FILTERED IMAGING; PLASMON-LOSS SPECTROSCOPY;

ELECTRON ENERGY LOSS SPECTROSCOPY;

EID: 14544293513     PISSN: 03682048     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.elspec.2003.12.009     Document Type: Article

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