Detector non-uniformity in scanning transmission electron microscopy

Ultramicroscopy

Volumn 124, Issue , 2013, Pages 52-60

  Findlay, S D ^a   LeBeau, J M ^b  

^a MONASH UNIVERSITY   (Australia)

^b North Carolina State University   (United States)

Author keywords

Detector efficiency.; High angle annular dark field (HAADF); Scanning transmission electron microscopy (STEM)

Indexed keywords

ANNULAR DETECTORS; BRIGHT FIELDS; DETECTOR EFFICIENCY; DETECTOR RESPONSE; HIGH-ANGLE ANNULAR DARK FIELDS; NON-TRIVIAL; NONUNIFORMITY; SCANNING TRANSMISSION ELECTRON MICROSCOPES; SCANNING TRANSMISSION ELECTRON MICROSCOPY; STANDARD DETECTORS;

TRANSMISSION ELECTRON MICROSCOPY;

DETECTORS;

ARTICLE; BRIGHTNESS; CAMERA; ERROR; IMAGE DISPLAY; IMAGE QUALITY; MATHEMATICAL ANALYSIS; QUALITATIVE ANALYSIS; QUANTITATIVE ANALYSIS; SCANNING TRANSMISSION ELECTRON MICROSCOPY; SENSITIVITY ANALYSIS; SIMULATION; DETECTOR NON UNIFORMITY; EQUIPMENT DESIGN; LIGHT SCATTERING; RADIATION DETECTOR; EQUIPMENT; METHODOLOGY;

MICROSCOPY, ELECTRON, SCANNING TRANSMISSION;

EID: 84868601561     PISSN: 03043991     EISSN: 18792723     Source Type: Journal    
DOI: 10.1016/j.ultramic.2012.09.001     Document Type: Article

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