Method to measure spatial coherence of subangstrom electron beams

Applied Physics Letters

Volumn 93, Issue 2, 2008, Pages

  Dwyer, Christian ^a   Erni, Rolf ^b   Etheridge, Joanne ^a  

^a MONASH UNIVERSITY   (Australia)

^b LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON BEAMS; PARTICLE BEAMS;

INTENSITY DISTRIBUTIONS; OBJECTIVE LENSES; SCANNING TRANSMISSION ELECTRON MICROSCOPE (STEM); SPATIAL COHERENCE;

TRANSMISSION ELECTRON MICROSCOPY;

EID: 47549101403     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2957648     Document Type: Article

References (14)

1. P. D. Nellist, G. Behan, A. I. Kirkland, and C. J. D. Hetherington, Appl. Phys. Lett. 89, 124105 (2006).
2. P. E. Batson, N. Dellby, and O. L. Krivanek, Nature (London) 418, 617 (2002).
3. P. E. Batson, Ultramicroscopy 106, 1104 (2006).
4. Y. Harada, T. Gota, and T. Someya, in Proceedings of the 8th Int. Cong. Electron Microsc. 1974 (unpublished), p. 110.
5. J. C. H. Spence and J. M. Cowley, J. Environ. Radioact. 50, 129 (1978).
6. M. Born and E. Wolf, Principles of Optics (Cambridge University Press, Cambridge, 2002).
7. W. C. T. Dowell and P. Goodman, Philos. Mag. 28, 471 (1973).
8. J. M. Cowley, Ultramicroscopy 4, 435 (1979).
9. M. Tanaka, M. Terauchi, and K. Tsuda, Convergent-Beam Electron Diffraction III (JEOL, Ltd., Tokyo, 1994).
10. J. M. Cowley, J. Electron Microsc. Tech. 3, 25 (1986).
11. P. D. Nellist and J. M. Rodenburg, Ultramicroscopy 54, 61 (1994).
12. E. M. James and J. M. Rodenburg, Appl. Surf. Sci. 111, 174 (1997).
13. J. C. H. Spence, High Resolution Electron Microscopy (Oxford University Press, New York, 2003).
14. P. N. H. Nakashima and A. W. S. Johnson, Ultramicroscopy 94, 135 (2003).